GD-OES at its best

ANALYZER FOR MANY TASKS

The Glow Discharge Analyzers are for many tasks, not only for chemical composition (bulk) analysis, as with conventional emission spectrometers, BUT ALSO an element depth profile analyzer as SIMS or SNMS. SPECTRUMA GDA can accomplish both tasks with one instrument - for the quality surface characterization on materials of various process of making, coating, layering, manufacturing, printing, finished products, the control of industrial processes and Research & Development investigations and much more .

For information on the Glow Discharge Analyzers, the software and further instrument options please CALL ON US

COMPACT yet powerful

ANALYZER FOR MANY TASKS

The Glow Discharge Analyzers by are among the most precise devices for the analysis of layer thicknesses and elemental compositions of solid materials.

The Glow Discharge Analyzers are particularly suitable for:

Analysis of the coating thickness of lacquers
Analysis of the thickness of compound layers after heat treatment
Analysis of (ultra)thin layers
Analysis of the coating weights
Analysis of the chemical composition of coatings, substrates and complex bulk materials like e.g. alloys
Analysis of concentrations and concentration gradients of elements
Analysis of diffusion at interfaces

FOR QUALITY CONTROL

ANALYZER FOR MANY TASKS

COMPLETE SPECTRA EVALUABLE. ALL SAMPLES POSSIBLE, CONDUCTIVE AND NON CONDUCTIVE

The GD-OES spectrometers are powerful instruments for Quality Control and Research, designed to take up 24/7 jobs and to be maintainable at the same time. They are developed primarily to study conductive samples, whereas it can also analyze electrically non-conductive samples. The instrument can be used e.g. for the following applications:

to determine the elemental concentration in layers and bulk material
to inspect the surfaces after diffusion processes
to examine galvanic coating processes
to analyze hard material coatings via PVD or CVD
to assess hot dip galvanizing as well as other kinds of galvanizing. AND MORE

COMPLETE SPECTRA EVALUABLE. ALL SAMPLES POSSIBLE, CONDUCTIVE AND NON CONDUCTIVE

Using the installed Radio Frequency (RF)Glow Discharge Lamp, is excelled in analyzing non-conductive materials such as ceramics, glass and paint layers, using the standard lamp set or a specially designed version for the universal sample unit (USU).

The instrument can be used e.g. for the following applications:

to analyze incoming base material
for depth profile in the production area
to inspect surfaces after diffusion processes
to examine galvanic coating processes
to analyze hard material coatings via PVD or CVD
to assess hot dip galvanizing as well as other kinds of galvanizing
to determine the elemental concentration in layers and bulk material
to analyze CIGS thin film solar cells
to analyze light elements, such as O, C, N and H
to analyze non-flat surfaces, such as pipes or spheres by using the USU

Due to the simple device operation and high speed of an analysis cycle it is possible to intervene quickly in the production process to correct any possible errors - a decisive advantage over conventional methods like metallographic investigations which need relatively long preparation time.

Advantages of the High Resolution CCD optics:

Flexibility in the selection of the element channels

Complete spectra evaluable

HIGH RESOLUTION OPTICS. MULTIPLE OPTICAL SYSTEM. SPECIAL SAMPLING

COMPLETE SPECTRA EVALUABLE. ALL SAMPLES POSSIBLE, CONDUCTIVE AND NON CONDUCTIVE

POWERFUL SOFTWARE. FULL SPECTRA. SPECIAL HYDROCARBON EFFECT REMOVAL

With up to 79 possible element channels, using photomultiplier tubes, the GD OES HR Glow Discharge Optical Emission Spectrometer is perfectly suitable for demanding applications requiring flexibility, high resolution and analytical precision.

The optional High Resolution CCD optics extends the analytical capabilities of the GDA OES HR into unmatched dimensions enabling the user to add an almost unlimited amount of analytical element channels to any given method. This flexibility permits the fast determination of the composition and thickness of technical coatings.

All elements including the light ones as H, O, N, Cl, C and even deuterium (D) can be identified quantitatively.

Moreover, the standard equipment of the GDA 750 HR includes the so-called external plasma igniter, which facilitates the analysis of materials that are hard to excite.

The instrument can be used e.g. for the following applications:

to analyze incoming base material
for depth profiling in the production area
to inspect surfaces after diffusion processes
to examine galvanic coating processes
to analyze hard material coatings via PVD or CVD
to assess hot dip galvanizing as well as other kinds of galvanizing
to determine the elemental concentration in layers and bulk material
to analyze CIGS thin film solar cells
to analyze light elements, such as O, C, N, and D
to analyze non-flat surfaces, such as pipes or spheres using the USU

POWERFUL SOFTWARE. FULL SPECTRA. SPECIAL HYDROCARBON EFFECT REMOVAL

COMPLETE SPECTRA EVALUABLE. ALL SAMPLES POSSIBLE, CONDUCTIVE AND NON CONDUCTIVE

POWERFUL SOFTWARE. FULL SPECTRA. SPECIAL HYDROCARBON EFFECT REMOVAL

With the development of the GD OES HR the evolution of CCD glow discharge analyzers has reached the next level.

The GD OES HR uses the latest CCD technology in optics, which combines high resolution and sensitivity. By using the direct light path without transmission losses best detection limits are guaranteed. It is the ideal solution for customers who want precision and flexibility.

To avoid hydrocarbon contaminations the GD OES HR is equipped with a scroll pump.

GD OES software is a user friendly software control program for the instruments.

Key features are:

Depth Measuring System: The current version contains initial basic support for the Depth Measuring System.
Linearised CCD Data: The current version allows you to determine and correct the non-linearity of the sensitivity of your CCD sensors. This makes more accurate calibrations of CCD channels possible. Additionally, artefacts are avoided when using dynamic CCD integration times and very sensitive spectral lines are to be detected.
Pseudo Channels in the Job: In the job, you may now define their colour and scaling. Additionally, you may specify whether the channels should be hidden in the graph.
Pseudo Channels in the Depth Profile: When calculating pseudo channels using the arithmetics function, you may now also use the display names of the channels if they are unique.
Flexible definition of properties for CCD channels (background correction, for instance)
Automatic background correction for improved repeatability for the lowest concentration
Programmable peak integration to improve detection limits for a lot of elements